Cher Ming Tan

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Electromigration Modeling at Circuit Layout Level
Electromigration Modeling at Circuit Layout LevelElectromigration Modeling at Circuit Layout Level
Electromigration Modeling at Circuit Layout Level
Cher Ming Tan, Feifei He
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI InterconnectionsApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Zhenghao Gan, Cher Ming Tan, Yuejin Hou, Wei Li
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